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Beilstein J. Nanotechnol. 2015, 6, 1082–1090, doi:10.3762/bjnano.6.109
Figure 1: Preparation and post-processing of the samples investigated in this work. Throughout the text the s...
Figure 2: SEM images of the samples. The 500 × 860 nm2 insets show the morphology of the post-processed Co/Pt...
Figure 3: Time-dependent conductance of the Pt layer of sample C normalized to its saturation value after the...
Figure 4: Hall voltage cycling at 10 K for all samples. Before measurements, all samples were saturated at 3 ...
Figure 5: TEM micrographs of sample C acquired (a) in the high angle annular dark field mode and (b) in the a...
Figure 6: (a) Cross-sectional and (b) lower layer in-plane EDX elemental peak intensities for sample C acquir...
Figure 7: The location of the probed layers is shown in panel (a). Nano-diffractograms of the upper (b) and t...
Figure 8: Isothermal Hall voltage cycling for sample D at a series of temperatures, as indicated. Insets: Tem...